Yoichi TANAKA is a Chief Researcher at KURITA WATER INDUSTRIES LTD, where he currently manages JDP activities with Interuniversity of Micro Electronics Centre (IMEC) in Belgium.
He has more than 10 years in the semiconductor industry on both the UPW facility and wet process business.
He began his semiconductor career developing particle analysis technology down to 10nm using Filter -SEM method, and engage to manage particle behavior in UPW with a major component supplier. He started the JDP project with IMEC for wet clean processes. He also has many patents, publications, and has developed several conference presentations.