Tom Bzik

Statistical Consultant, EMD Electronics


Tom currently works as a statistical consultant for EMD Electronics and as an independent statistical consultant after an extended career at Air Products and Chemicals, Inc.  He is Chair of ASTM – E11, Quality and Statistics, which manages an extensive portfolio of international statistical standards.  He chaired the Statistical Methods Task Force in SEMI International Standards for over 20 years.  Tom has taught classes at several universities including his alma mater the University of Connecticut.  He was the keynote speaker at ASTM’s Symposium for Detection Limits in 2018.  Tom has extensively published papers and presentations with a focus on properly handling the unique data characteristics of trace contamination data.  He considers difficult problems to solve “fun”.