Gary Van Schooneveld is President of CT Associates, Inc.  Gary has 30 years of experience with high-purity fluid systems including chemical delivery and ultrapure water and the development and testing of their associated materials and components.  He is the author or co-author of more than 45 technical papers and presentations.  Gary is an active member of the IRDS UPW and SEMI UPW Task Forces and has been a key contributor in the development of SEMI test methods for measuring filter retention below 15 nm, particle shedding from critical components and ion exchange resin rinse performance.  Gary has BS and MS degrees in Materials Engineering from Rensselaer Polytechnic Institute (Troy, NY) and an MBA from the University of Texas (Arlington, TX).