Dan Rodier is a Technologist at Particle Measuring Systems. He has a Ph.D. in analytical chemistry from the University of Colorado and has over 25 years of experience developing and implementing technologies and strategies to measure airborne molecular species and particulate contamination. Dr. Rodier has five patents for microcontamination monitoring and control technologies. He has worked with customers across Asia, Europe, and North America to implement monitoring programs in the semiconductor/electronics industries.